Cimang Lu Posted December 1, 2021 by vlsidev_qn81ur & filed under Technology Papers. Recipient: Cimang Lu Paper:Design and Demonstration of Reliability-Aware Ge Gate Stacks with 0.5 nm EOT Authors: Cimang Lu, Choong Hyun Lee, Tomonori Nishimura and Akira Toriumi Affiliation:The University of Tokyo, JST-CREST
