2024 IEEE Symposium on VLSI Technology & Circuits
2024 IEEE Symposium on VLSI Technology & Circuits
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Chien-Tai Chan

Posted December 1, 2021 by vlsidev_qn81ur & filed under Technology Papers.

Recipient: Chien-Tai Chan

Paper: Investigation of Post-NBTI Stress Recovery in pMOSFETs by Direct Measurement of Single Oxide Charge De-Trapping

Authors: Chien-Tai Chan, Huan-Chi Ma, Chun-Jung Tang and Tahui Wang

Affiliation: National Chiao-Tung University

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