Recipient: ChoongHyun Lee
Paper: Enhancement of High-Ns Electron Mobility in Sub-nm EOT Ge n-MOSFETs
Authors: ChoongHyun Lee, Cimang Lu, Toshiyuki Tabata, Tomonori Nishimura, Kosuke Nagashio, and Akira Toriumi
Affiliation: The University of Tokyo
Posted by vlsidev_qn81ur & filed under Technology Papers.
Recipient: ChoongHyun Lee
Paper: Enhancement of High-Ns Electron Mobility in Sub-nm EOT Ge n-MOSFETs
Authors: ChoongHyun Lee, Cimang Lu, Toshiyuki Tabata, Tomonori Nishimura, Kosuke Nagashio, and Akira Toriumi
Affiliation: The University of Tokyo
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